Analog Terminal Adaptors (ATA, FXS)

Analog Terminal Adaptor (ATA) device testing includes performance tests for analog and digital interfaces. Additional performance requirements are provided for Environmental considerations.

  • Transitions to the Idle State
  • Idle State Operations
  • Stopping Signal Generation Upon Entering the Idle State
  • DC Voltage and Off-hook Termination Detection
  • Immunity to Short Off-hook Terminations
  • Crosstalk Interference
  • VMWI Feature Performance
  • Alerting State Transitions
  • Alerting State Operations
  • Alerting State Timings After Receiving an INVITE: Message
  • FXS Port Ringer Drive and DC Voltage
  • Ringing Signal Timing Patterns
  • Ring Trip (Off-hook Termination) Detection
  • Caller-ID Feature Performance
  • Originating-Call State Transitions
  • Originating-Call State Operations
  • DC Voltage and Current
  • DTMF Receiver Response Timing
  • Dial Tone or Stutter Dial Tone Generation
  • Removal of Dial Tone After DTMF Reception
  • Dialing Plan and Call Set-up Timing
  • Response to SIP Response Code Messages after INVITE:
  • Originating-Call State Time-Out Procedures
  • Disconnect Signal Detection
  • FXS Port Off-Hook Voice-band Impedance Return Loss
  • DTMF Receiver Performance
  • Talk State Transitions
  • Talk State Operations
  • FXS Port DC Voltage and Current
  • FXS Port Off-Hook Voice-band Impedance Return Loss
  • Flash Signal and Disconnect Signal Detection
  • Timed Disconnect Signal Generation
  • Call Waiting Feature
  • 3-Way Calling Feature
  • Echo Cancellation
  • Reflected Echo Cancellation
  • Crosstalk Interference
  • Speech Path Performance
  • Data Transmission Performance
  • DTMF Generation Performance
  • Dial Tone
  • Stutter Dial Tone
  • Recall Dial Tone
  • Ringback Tone
  • Busy Tone
  • Reorder Tone
  • Call Waiting Tone
  • Special Information Tone
  • Receiver Off-hook Warning Tone
  • Talk State RFC2833 Call Progress Signal Generation
  • Lightning Immunity
    • Signal leads
    • Power leads
  • Electro-Static Discharge (ESD)
    • Air discharge
    • Direct contact discharge
    • In-direct contact discharge
  • AC Power Variations
    • Transient interruptions
    • Short term voltage sags
    • long term interruptions
  • Temperature and Humidity
    • Operating conditions
    • Storage conditions
  • Drop Testing
    • Packaged
    • Unpackaged
  • Vibration
  • Immunity Radiated Electric Field (E-field) Interference
  • Immunity Conducted Interference on Signal Leads
  • Immunity Conducted Interference on Power Leads
  • Measuring performance of:
    • Receive level of acoustic output
    • Transmit level of electrical output
    • Functionality during application of the interference

Using Bell Labs 1980 “Noise Survey of the Loop Plant” published in the Bell System Technical Journal in 1984 as the basis for the common mode noise parameters to use for testing and real world environmental simulation.

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