Gateways (FXO, VoIP)

• Electrical Interface (TIA-470.210-F)
  • Impedance and Resistance
  • DC Voltage Operating Range
  • Non-Response to PSTN Line Maintenance Signals
• Operation When First Connected to a Telephone Line (TIA-968-B)
• Visual Message Waiting Indicator (VMWI) Reception (TIA-777-A)
• Cross-talk Protection Performance (TIA-912-C)

• Electrical Interface (TIA-470.210-F)
• Ring Detection (TIA-470.220-E)
• Auto-Answer Timing
• Caller-ID Reception (TIA-777-A)

• Electrical Interface (TIA-470.210-F)
  • Impedance and Resistance
  • DC Voltage Operating Range
• Non-Response to DC Signals
• Parallel Phone Off-hook
• Line State Transitions – Port Release after BYE: Message
• FXO Port Selection for Outgoing Calls and Disconnect Timing
• Emergency Call (911) FXO Port Takeover
• Dialtone and Stutter Dialtone Signal Detection
• FXO Port Speech Path Connection Delays
• Flash Signal Generation
• Detection of Timed Disconnect Signal (TDS)
• Talk State Transition Interruption From Ring-Trip Delays
• Caller-ID With Call Waiting Reception
• Call Waiting Reception
• Call Progress Signals Detection
• Call Progress Signals Generation (Call state and RFC 2833)
• Cross-talk Protection (TIA-912-C)
• DTMF Detection and Generation
• Speech Path (TIA-912-C)
• Echo Control
• Data Transmission (TIA-912-C)

• Lightning Immunity
  • Signal leads
  • Power leads
• Electro-Static Discharge (ESD)
  • Air discharge
  • Direct contact discharge
  • In-direct contact discharge
• AC Power Variations
  • Transient interruptions
  • Short term voltage sags
  • long term interruptions
• Temperature and Humidity
  • Operating conditions
  • Storage conditions
• Drop Testing
  • Packaged
  • Unpackaged
• Vibration

• Immunity Radiated Electric Field (E-field) Interference
• Immunity Conducted Interference on Signal Leads
• Immunity Conducted Interference on Power Leads

• Measuring performance of:
  • Receive level of acoustic output
  • Transmit level of electrical output
  • Functionality during application of the interference

Using Bell Labs 1980 “Noise Survey of the Loop Plant” published in the Bell System Technical Journal in 1984 as the basis for the common mode noise parameters to use for testing and real world environmental simulation.